Simultaneous high-resolution x-ray backlighting and self-emission imaging for laser-produced plasma diagnostics using a two-energy multilayer Kirkpatrick–Baez microscope

Yi S. Z.; Dong J. Q.; Jiang L.; Huang Q. S.; Guo E. F.; Z. S. Wang

doi:10.1063/5.0062758

Volume 7 Issue 1

Jan. 2022

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Article Navigation > Matter and Radiation at Extremes > 2022 > 7(1): 015902

Yi S. Z., Dong J. Q., Jiang L., Huang Q. S., Guo E. F., Z. S. Wang. Simultaneous high-resolution x-ray backlighting and self-emission imaging for laser-produced plasma diagnostics using a two-energy multilayer Kirkpatrick–Baez microscope[J]. Matter and Radiation at Extremes, 2022, 7(1): 015902. doi: 10.1063/5.0062758

Citation:

Yi S. Z., Dong J. Q., Jiang L., Huang Q. S., Guo E. F., Z. S. Wang. Simultaneous high-resolution x-ray backlighting and self-emission imaging for laser-produced plasma diagnostics using a two-energy multilayer Kirkpatrick–Baez microscope[J]. Matter and Radiation at Extremes, 2022, 7(1): 015902. doi: 10.1063/5.0062758

Citation:

Yi S. Z., Dong J. Q., Jiang L., Huang Q. S., Guo E. F., Z. S. Wang. Simultaneous high-resolution x-ray backlighting and self-emission imaging for laser-produced plasma diagnostics using a two-energy multilayer Kirkpatrick–Baez microscope[J]. Matter and Radiation at Extremes, 2022, 7(1): 015902. doi: 10.1063/5.0062758

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Simultaneous high-resolution x-ray backlighting and self-emission imaging for laser-produced plasma diagnostics using a two-energy multilayer Kirkpatrick–Baez microscope

doi: 10.1063/5.0062758

Yi S. Z.^{1, 2},
Dong J. Q.³,
Jiang L.^{1, 2},
Huang Q. S.^{1, 2},
Guo E. F.³,
Z. S. Wang^{1, 2
,
,
,}

1.
MOE Key Laboratory of Advanced Micro-Structured Materials, No. 1239 Siping Road, Shanghai 200092, China
2.
School of Physics Science and Engineering, Tongji University, Shanghai 200092, China
3.
Shanghai Institute of Laser Plasma, CAEP, P.O. Box 919-988, Shanghai 201800, China

More Information

Corresponding author: a)Author to whom correspondence should be addressed: wangzs@tongji.edu.cn
Received Date: 2021-07-08
Accepted Date: 2021-11-03

Available Online: 2022-01-01

Publish Date: 2022-01-01

Abstract

Abstract

A simultaneous high-resolution x-ray backlighting and self-emission imaging method for laser-produced plasma diagnostics is developed in which two Kirkpatrick–Baez imaging channels for high-energy and low-energy diagnostics are constructed using a combination of multilayer mirrors in near-coaxial form. By using a streak or framing camera placed on the image plane, both backlit and self-emission images of a laser-produced plasma with high spatial and temporal resolution can be obtained simultaneously in a single shot. This paper describes the details of the method with regard to its optical and multilayer design, assembly, and alignment method. In addition, x-ray imaging results with a spatial resolution better than 5 µm in the laboratory and experimental results with imploding capsules in the SG-III prototype laser facility are presented.

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References(13)

References

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